Wang, J., Kuch, W., Chelaru, L. I., Offi, F., Kotsugi, M.

Polarization dependent x-ray photoemission electron microscopy was used to investigate the influence of the exchange bias coupling on the disordered ultrathin single-crystalline fcc Fe₅₀Mn₅₀. We find that the critical thickness of the FeMn film, where the antiferromagnetic (AF) order is formed, varies with changing the magnetization direction of the ferromagnetic (FM) layer from out-of-plane to in-plane. Surface magneto-optical Kerr effect measurements (SMOKE) further manifest the shift of the critical thickness with alternating the exchange bias coupling. It indicates that the spin structure of the FeMn layer near the FM layer is modified by the presence of exchange bias coupling and the properties of the coupling. Our results provide direct experimental evidence that the AF spin structure at the interface between the FM and AF layers is strongly influenced by the exchange bias coupling.

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